"Design of Autonomous TPG Circuits for Use in Two-Pattern Testing."

Kiyoshi Furuya, Seiji Seki, Edward J. McCluskey (1995)

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DOI: —

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type: Journal Article

metadata version: 2020-04-11

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Kiyoshi Furuya, Seiji Seki, Edward J. McCluskey:
Design of Autonomous TPG Circuits for Use in Two-Pattern Testing. IEICE Trans. Inf. Syst. 78-D(7): 882-888 (1995)

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